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Volumn , Issue , 2007, Pages 110-114

Transient non-linear thermal FEM simulation of smart power switches and verification by measurements

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; ELECTRIC BREAKDOWN; ELECTRIC CONDUCTIVITY; MATERIALS SCIENCE; NONMETALS; POWER ELECTRONICS; SEMICONDUCTOR MATERIALS; SILICON; SWITCHES; THERMODYNAMIC PROPERTIES;

EID: 48049103034     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/THERMINIC.2007.4451757     Document Type: Conference Paper
Times cited : (18)

References (13)
  • 1
    • 4944255120 scopus 로고    scopus 로고
    • Thermal Destruction Testing: An Indirect Approach to a Simple Dynamic Thermal Model of Smart Power Switches
    • M. Glavanovics, H. Zitta, "Thermal Destruction Testing: an Indirect Approach to a Simple Dynamic Thermal Model of Smart Power Switches," ESSCIRC 2001, Proc. p.236 ff.
    • ESSCIRC 2001, Proc
    • Glavanovics, M.1    Zitta, H.2
  • 2
    • 17644402837 scopus 로고    scopus 로고
    • Impact of Thermal Overload Operation on Wirebond and Metallization Reliability in Smart Power Devices
    • M. Glavanovics, T. Detzel, K. Weber, "Impact of Thermal Overload Operation on Wirebond and Metallization Reliability in Smart Power Devices," ESSDERC 2004
    • (2004) ESSDERC
    • Glavanovics, M.1    Detzel, T.2    Weber, K.3
  • 3
    • 0034449593 scopus 로고    scopus 로고
    • Reliability Characterization of LDMOS Transistors submitted to Multiple Energy Discharges
    • M. Bosc et al, "Reliability Characterization of LDMOS Transistors submitted to Multiple Energy Discharges," ISPSD'2000 Proceedings, Cat.Nr.00CH37094C
    • ISPSD'2000 Proceedings, Cat.Nr.00CH37094C
    • Bosc, M.1
  • 4
    • 17644395265 scopus 로고    scopus 로고
    • Fast thermal fatigue on top metal layer of power devices
    • Elsevier Science Ltd
    • S. Russo et al, "Fast thermal fatigue on top metal layer of power devices," Microelectronics Reliability 42 (2002), pp 1617-1622, Elsevier Science Ltd
    • (2002) Microelectronics Reliability , vol.42 , pp. 1617-1622
    • Russo, S.1
  • 5
    • 17644395266 scopus 로고    scopus 로고
    • Reliability of power transistors against application driven temperature swings
    • Elsevier Science Ltd
    • S. Gopalan et al, "Reliability of power transistors against application driven temperature swings," Microelectronics Reliability (2002), Elsevier Science Ltd
    • (2002) Microelectronics Reliability
    • Gopalan, S.1
  • 6
    • 0033097511 scopus 로고    scopus 로고
    • Thermal modeling and experimentation to determine maximum power capability of SCR's and
    • March
    • William D. Walker, William F. Weldon, "Thermal modeling and experimentation to determine maximum power capability of SCR's and," IEEE Trans. on power electronics, vol. 14 No 2, pp. 316-322, March 1999.
    • (1999) IEEE Trans. on power electronics , vol.14 , Issue.2 , pp. 316-322
    • Walker, W.D.1    Weldon, W.F.2
  • 11
    • 2442447000 scopus 로고    scopus 로고
    • Studies on the nonlinearity effects in dynamic compact model generation of packages
    • M. Rencz and V. Szekely, "Studies on the nonlinearity effects in dynamic compact model generation of packages," IEEE Transactions on Components and Packaging Technologies, vol. 27, pp. 124-130, 2004.
    • (2004) IEEE Transactions on Components and Packaging Technologies , vol.27 , pp. 124-130
    • Rencz, M.1    Szekely, V.2
  • 12
    • 48049112518 scopus 로고    scopus 로고
    • Thermische Modellierung leistungselektronischer Systeme
    • Schweiz
    • M. März, P. Nance, "Thermische Modellierung leistungselektronischer Systeme," MegaLink 16, Schweiz, 1999, pp. 16-19
    • (1999) MegaLink , vol.16 , pp. 16-19
    • März, M.1    Nance, P.2
  • 13
    • 48049112302 scopus 로고    scopus 로고
    • FlexPDE User Guide Version 4, Jan. 2004, Available: http://www.flexpde. com
    • FlexPDE User Guide Version 4, Jan. 2004, Available: http://www.flexpde. com


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.