Polynomial phase mask for extending depth-of-field optimized by simulated annealing

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6832, Issue , 2008, Pages

  Caron, Nicolas ^a   Sheng, Yunlong ^a  

^a UNIVERSITÉ LAVAL   (Canada)

Author keywords

Deconvolution; Depth of field; Phase mask; Simulated annealing

Indexed keywords

ANNEALING; CONVOLUTION; DATA RECORDING; HISTORIC PRESERVATION; HOLOGRAPHIC INTERFEROMETRY; HOLOGRAPHY; LASER RECORDING; OPTICAL SYSTEMS; OPTICAL TRANSFER FUNCTION; OPTOELECTRONIC DEVICES; POLYNOMIAL APPROXIMATION; POLYNOMIALS;

CARTESIAN COORDINATE SYSTEMS; DEGREE OF FREEDOMS; DEPTH OF FIELDS; DEPTH-OF-FIELD; DIGITAL RESTORATIONS; ELECTRONIC IMAGING; PHASE MASK; POLYNOMIAL CO-EFFICIENTS; POLYNOMIAL PHASE;

SIMULATED ANNEALING;

EID: 47949121541     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.754805     Document Type: Conference Paper

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