Deformation controlled assembly of binary microgel thin films

Langmuir

Volumn 24, Issue 14, 2008, Pages 7216-7222

  Sorrell, Courtney D ^a   Lyon, L Andrew ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION FROM SOLUTION; AMERICAN CHEMICAL SOCIETY (ACS); ATOMIC FORCE MICROSCOPY (AFM); CONTROLLED ASSEMBLY; CORE/SHELL PARTICLES; FILM COMPOSITIONS; HYDROGEL; MICRO GELS; MICRO PARTICLES; MICRO-GELS; MODEL PREDICTIONS; MONOLAYER FILMS; PARTICLE ADSORPTION; PARTICLE DEFORMATION; PARTICLE SOFTNESS; RANDOM SEQUENTIAL ADSORPTION (RSA) MODEL; SCATTERING TECHNIQUES; SOFT PARTICLES; SOLID SUBSTRATE (SS); SOLUTION COMPOSITIONS; SOLUTION DIFFUSION; SURFACE ADSORPTION; SURFACE COVERAGES; TWO-COMPONENT;

ADSORPTION; ATOMIC FORCE MICROSCOPY; BINARY MIXTURES; COLLOIDS; DEFORMATION; FORECASTING; IONIC LIQUIDS; MICROSCOPIC EXAMINATION; MIXTURES; MOLECULAR INTERACTIONS; POPULATION STATISTICS; SCANNING PROBE MICROSCOPY; SURFACE DIFFUSION; THICK FILMS;

IMAGING TECHNIQUES;

CROSS LINKING REAGENT;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; GEL; PARTICLE SIZE; SURFACE PROPERTY;

CROSS-LINKING REAGENTS; GELS; MICROSCOPY, ATOMIC FORCE; PARTICLE SIZE; SURFACE PROPERTIES;

EID: 47949110884     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la800092q     Document Type: Article

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