Software defects prediction using operating characteristic curves

2007 IEEE International Conference on Information Reuse and Integration, IEEE IRI-2007

Volumn , Issue , 2007, Pages 713-718

  Bergander, Torsten ^a   Luo, Yan ^b   Hamza, A Ben ^b  

^a SAP Canada Inc   (Canada)

^b Concordia University ^*  (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

FORECASTING; INFORMATION USE; MATHEMATICAL MODELS;

BAYESIAN PREDICTION; CUMULATIVE NUMBER; IMPROVED PERFORMANCE; INFORMATION RE-USE; INTERNATIONAL CONFERENCES; OPERATING CHARACTERISTICS; PREDICTION METHODS; SOFTWARE DEFECTS; SOFTWARE DEVELOPMENT PROCESSES; SOFTWARE FAILURES; TEST ING PHASE;

SOFTWARE TESTING;

EID: 47949108753     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRI.2007.4296704     Document Type: Conference Paper

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