Electrolytic capacitor failure mechanism due to inrush current

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn , Issue , 2007, Pages 730-736

  Imam, Afroz M ^a   Divan, Deepak M ^a   Harley, Ronald G ^a   Habetler, Thomas G ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ELECTROLYTIC CAPACITORS; ANNUAL MEETINGS; APPLICATION PARAMETERS; FAILURE MECHANISMS; IN-RUSH CURRENTS; SURGE VOLTAGES; TRANSIENT VOLTAGES; VOLTAGE CAPABILITY; WORKING VOLTAGES;

ALUMINA; CAPACITANCE; DIELECTRIC DEVICES; ELECTRIC CURRENTS; ELECTRIC EQUIPMENT; ELECTROLYTIC CAPACITORS; ENERGY STORAGE; LIGHT METALS;

CAPACITORS;

EID: 47849123726     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IAS.2007.115     Document Type: Conference Paper

References (3)

1. Cornell Dubilier, Liberty, SC 29657, "Aluminum. Electrolytic Capacitors Application Guide," http://www.cde.com/new/appguide,
2. Micro Photonics Inc. PO Box 3129, Allentown, PA 18106-0129. http://www.microphotonics.com/labmicroct.html,
3. O. Klug and A. Bellavia, "High Voltage Aluminum Electrolytic Capacitors: Where is the Limit?" Evox Rifa Electrolytic Capacitors, Sweden, 2001.