Space-charge-controlled electro-optic effect: Optical beam deflection by electro-optic effect and space-charge-controlled electrical conduction

Journal of Applied Physics

Volumn 104, Issue 1, 2008, Pages

  Nakamura, Koichiro ^a,b   Miyazu, Jun ^a   Sasaki, Yuzo ^a   Imai, Tadayuki ^a   Sasaura, Masahiro ^a   Fujiura, Kazuo ^a  

^a NTT CORPORATION   (Japan)

^b RICOH COMPANY LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC COMPOUNDS; ATOMS; DEFLECTION (STRUCTURES); ELECTRIC FIELD EFFECTS; ELECTRIC FIELDS; ELECTRIC NETWORK ANALYSIS; ELECTRIC SPACE CHARGE; ELECTRODES; ELECTROLYSIS; ELECTROMAGNETIC FIELD THEORY; ELECTROMAGNETIC FIELDS; ELECTROOPTICAL DEVICES; FERROELECTRIC MATERIALS; FERROELECTRICITY; HEAT CONDUCTION; KERR MAGNETOOPTICAL EFFECT; MAGNETIC FIELD EFFECTS; MAGNETOOPTICAL EFFECTS; METALLIZING; OHMIC CONTACTS; OPTICAL KERR EFFECT; OZONE WATER TREATMENT; POWDERS; REFRACTIVE INDEX;

AMERICAN INSTITUTE OF PHYSICS (AIP); DEFLECTION (OVALIZATION); ELECTRICAL CONDUCTION; ELECTRO OPTIC; ELECTRO-OPTIC EFFECTS; ELECTROOPTIC KERR EFFECT; FERROELECTRIC DOMAINS; GEOMETRICAL SHAPES; GRADED REFRACTIVE INDEX (GRIN); INJECTED ELECTRONS; INTERACTION LENGTH; LARGE DEFLECTIONS; NON UNIFORM; OPERATING PRINCIPLES; OPTICAL BEAM DEFLECTION (OBD); OPTICAL BEAMS; RECTANGULAR SHAPES; SPACE CHARGES; SQUARE-ROOT DEPENDENCE;

OPTICAL PROPERTIES;

EID: 47749142834     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2949394     Document Type: Article

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