Electron transport simulations of a multilead system using the impulse-response method

Surface and Interface Analysis

Volumn 40, Issue 6-7, 2008, Pages 1113-1116

  Suzuki, Taku ^a   Goto, Hidekazu ^a   Hirose, Kikuji ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Electronic transport simulation; Impulse response method; Multilead system; Nanostructure

Indexed keywords

DOSIMETRY; ELECTRON TRANSITIONS; ELECTRON TRANSPORT PROPERTIES; ELECTRONS; FUNCTIONS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; SYSTEMS ENGINEERING; TWO DIMENSIONAL; WAVE FUNCTIONS;

COMPUTATIONAL SCHEMES; ELECTRON TRANSPORT SIMULATIONS; ELECTRON TRANSPORTATION; FINITE DIFFERENCE (FD); INITIAL STATES; NANO SCALING; NANOSCALE ELECTRONIC DEVICES; REAL-SPACE; SIMULATION METHODS; TIME EVOLUTIONS; TWO-DIMENSIONAL (2D);

FINITE DIFFERENCE METHOD;

EID: 47749136969     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2873     Document Type: Conference Paper

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