9 Robustness testing of CE methods

Separation Science and Technology

Volumn 9, Issue , 2008, Pages 185-224

  Dejaegher, Bieke ^a   Vander Heyden, Yvan ^a  

^a PHARMACEUTICAL INSTITUTE   (Belgium)

Author keywords

(Half) normal probability plots; Algorithm of Dong; Experimental design; Factors responses (critical) effects; Method validation; Non significance interval; Robustness tests; SST limits

Indexed keywords

EID: 47749090512     PISSN: 01496395     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Review

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