-
2
-
-
4243683822
-
-
0163-1829 10.1103/PhysRevB.50.6082.
-
C. W. Nan, Phys. Rev. B 0163-1829 10.1103/PhysRevB.50.6082 50, 6082 (1994).
-
(1994)
Phys. Rev. B
, vol.50
, pp. 6082
-
-
Nan, C.W.1
-
3
-
-
22244450797
-
-
0022-3727 10.1088/0022-3727/38/8/R01.
-
M. Fiebig, J. Phys. D 0022-3727 10.1088/0022-3727/38/8/R01 38, R123 (2005).
-
(2005)
J. Phys. D
, vol.38
, pp. 123
-
-
Fiebig, M.1
-
4
-
-
39349110724
-
-
See, for example, 0021-8979 10.1063/1.2836410, (), and references therein.
-
See, for example, C. W. Nan, M. I. Bichurin, S. X. Dong, D. Viehland, and G. Srinivasan, J. Appl. Phys. 0021-8979 10.1063/1.2836410 103, 031101 (2008), and references therein.
-
(2008)
J. Appl. Phys.
, vol.103
, pp. 031101
-
-
Nan, C.W.1
Bichurin, M.I.2
Dong, S.X.3
Viehland, D.4
Srinivasan, G.5
-
5
-
-
33751082061
-
-
0021-8979 10.1063/1.2358191, ();, J. Appl. Phys. 0021-8979 10.1063/1.2800804 102, 083911 (2007).
-
J. P. Zhou, H. C. He, Z. Shi, G. Liu, and C. W. Nan, J. Appl. Phys. 0021-8979 10.1063/1.2358191 100, 094106 (2006); M. Liu, X. Li, J. Lou, S. Zheng, K. Du, and Nian X. Sun, J. Appl. Phys. 0021-8979 10.1063/1.2800804 102, 083911 (2007).
-
(2006)
J. Appl. Phys.
, vol.100
, pp. 094106
-
-
Zhou, J.P.1
He, H.C.2
Shi, Z.3
Liu, G.4
Nan, C.W.5
Liu, M.6
Li, X.7
Lou, J.8
Zheng, S.9
Du, K.10
Sun, N.X.11
-
8
-
-
33645810821
-
-
0163-1829 10.1103/PhysRevB.73.134416.
-
T. Wu, M. A. Zurbuchen, S. Saha, J. Mitchell, and S. K. Streiffer, Phys. Rev. B 0163-1829 10.1103/PhysRevB.73.134416 73, 134416 (2006).
-
(2006)
Phys. Rev. B
, vol.73
, pp. 134416
-
-
Wu, T.1
Zurbuchen, M.A.2
Saha, S.3
Mitchell, J.4
Streiffer, S.K.5
-
9
-
-
33750517129
-
-
0955-2219 10.1016/j.jeurceramsoc.2006.02.041.
-
Q. H. Jiang, Z. J. Shen, J. P. Zhou, Z. Shi, and C. W. Nan, J. Eur. Ceram. Soc. 0955-2219 10.1016/j.jeurceramsoc.2006.02.041 27, 279 (2007).
-
(2007)
J. Eur. Ceram. Soc.
, vol.27
, pp. 279
-
-
Jiang, Q.H.1
Shen, Z.J.2
Zhou, J.P.3
Shi, Z.4
Nan, C.W.5
-
10
-
-
35348831716
-
-
0021-8979 10.1063/1.2785818, ();, Acta Mater. 1359-6454 10.1016/j.actamat.2007.10.004 56, 405 (2008).
-
C. Y. Deng, Y. Zhang, J. Ma, Y. H. Lin, and C. W. Nan, J. Appl. Phys. 0021-8979 10.1063/1.2785818 102, 074114 (2007); C. Y. Deng, Y. Zhang, J. Ma, Y. H. Lin, and C. W. Nan, Acta Mater. 1359-6454 10.1016/j.actamat.2007.10.004 56, 405 (2008).
-
(2007)
J. Appl. Phys.
, vol.102
, pp. 074114
-
-
Deng, C.Y.1
Zhang, Y.2
Ma, J.3
Lin, Y.H.4
Nan, C.W.5
Deng, C.Y.6
Zhang, Y.7
Ma, J.8
Lin, Y.H.9
Nan, C.W.10
-
12
-
-
47749128569
-
-
note
-
There are two different characteristic modes for magnetic-electric effects. The first is an active mode, such as the magnetoresistive (MR) and magnetodielectric (MD) effect. In the MR effect, it requires a constant dc test current I passing through the samples to obtain a voltage amplitude change induced by a magnetic field. In the MD effect, it requires an ac test current passing through the samples to obtain capacitive signal change induced by a magnetic field (or a dc pulse test voltage on the sample to obtain polarization signal change induced by a magnetic field in the P-E loop measurement). Thus when making ME measurement on multiferroic samples in the active mode (i.e., direct measurement of the P-E loop or dielectric constant change under the applied magnetic field), we have to consider the contribution from the MR and interfacial capacitive effects (or Maxwell-Wagner interfacial polarization effect). In the present ME measurement, which is the passive mode, there is no dc and ac test currents (or dc test voltage) through the samples, and an induced ME voltage by the magnetic field is directly read. Meanwhile, the MR effect in the present case is very small (about 0.2% at room temperature) and the convincing MD effect is even not measurable. Thus the very slight MR and MD effects appearing in the active mode would not make a contribution to the ME output signals (Fig.) measured in this passive mode.
-
-
-
-
13
-
-
2942522982
-
-
0021-8979 10.1063/1.1699499.
-
J. Y. Zhai, N. Cai, Z. Shi, Y. H. Lin, and C. W. Nan, J. Appl. Phys. 0021-8979 10.1063/1.1699499 95, 5685 (2004).
-
(2004)
J. Appl. Phys.
, vol.95
, pp. 5685
-
-
Zhai, J.Y.1
Cai, N.2
Shi, Z.3
Lin, Y.H.4
Nan, C.W.5
-
14
-
-
0028464852
-
-
1045-389X 10.1177/1045389X9400500406, ();, Phys. Rev. B 68, 054402 (2003)
-
M. Avellaneda and G. Harshe, J. Intell. Mater. Syst. Struct. 1045-389X 10.1177/1045389X9400500406 5, 501 (1994); M. I. Bichurin, V. M. Petrov, and G. Srinivasan, Phys. Rev. B 68, 054402 (2003)
-
(1994)
J. Intell. Mater. Syst. Struct.
, vol.5
, pp. 501
-
-
Avellaneda, M.1
Harshe, G.2
Bichurin, M.I.3
Petrov, V.M.4
Srinivasan, G.5
-
15
-
-
22144447158
-
-
0022-3727 10.1088/0022-3727/38/14/005.
-
G. Liu, C. W. Nan, Z. K. Xu, and H. Chen, J. Phys. D 0022-3727 10.1088/0022-3727/38/14/005 38, 2321 (2005).
-
(2005)
J. Phys. D
, vol.38
, pp. 2321
-
-
Liu, G.1
Nan, C.W.2
Xu, Z.K.3
Chen, H.4
|