Impact of process variation induced transistor mismatch on sense amplifier performance

Proceedings - 2006 14th International Conference on Advanced Computing and Communications, ADCOM 2006

Volumn , Issue , 2006, Pages 497-502

  Rodrigues, Steevan ^a   Bhat, M S ^a  

^a NATIONAL INSTITUTE OF TECHNOLOGY KARNATAKA   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC COMPOUNDS; DATA STORAGE EQUIPMENT; INTEGRATED CIRCUIT MANUFACTURE;

90 NM TECHNOLOGY; CIRCUIT DESIGNS; COMPARATIVE STUDIES; DEVICE DIMENSIONS; INTERNATIONAL CONFERENCES; MEMORY ACCESS TIME; PARAMETER VARIATIONS; PERIPHERAL (SPI); POWER DISSIPATIONS; PROCESS VARIATIONS; SENSE AMPLIFIER (SA); TRANSISTOR MISMATCH; YIELD LOSSES;

PROCESS ENGINEERING;

EID: 47649124551     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ADCOM.2006.4289943     Document Type: Conference Paper

References (11)

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