Quantitative trait loci for high-temperature adult-plant and slow-rusting resistance to Puccinia striiformis f. sp. tritici in wheat cultivars

Phytopathology

Volumn 98, Issue 7, 2008, Pages 803-809

  Guo, Q ^a   Zhang, Z J ^a   Xu, Y B ^a   Li, G H ^a   Feng, J ^a   Zhou, Y ^a  

^a CHINA AGRICULTURAL UNIVERSITY   (China)

Author keywords

Durable resistance; Simple sequence repeat; Yellow rust

Indexed keywords

ARTICLE; BASIDIOMYCETES; CHROMOSOME MAP; CROSS BREEDING; GENETICS; GENOTYPE; HEAT; HOST PATHOGEN INTERACTION; INNATE IMMUNITY; MICROBIOLOGY; PHYSIOLOGY; PLANT CHROMOSOME; PLANT DISEASE; QUANTITATIVE TRAIT LOCUS; WHEAT;

BASIDIOMYCOTA; CHROMOSOME MAPPING; CHROMOSOMES, PLANT; CROSSES, GENETIC; GENOTYPE; HOST-PATHOGEN INTERACTIONS; HOT TEMPERATURE; IMMUNITY, INNATE; PLANT DISEASES; QUANTITATIVE TRAIT LOCI; TRITICUM;

PUCCINIA STRIIFORMIS F. SP. TRITICI; TRITICUM AESTIVUM;

EID: 47649124303     PISSN: 0031949X     EISSN: None     Source Type: Journal    
DOI: 10.1094/PHYTO-98-7-0803     Document Type: Article

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