Structure analysis and optical properties of heat-induced crystalline high reflection SbOx films

Guangxue Xuebao/Acta Optica Sinica

Volumn 24, Issue 7, 2004, Pages 890-892

  Fang, Ming ^a   Li, Qinghui ^a   Gan, Fuxi ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Differential scanning calorimeter; Heat induced crystallization; Optical properties; Optical storage; SbOx thin films

Indexed keywords

ANNEALING; ANTIMONY; ANTIMONY COMPOUNDS; CRYSTALLIZATION; DIFFERENTIAL SCANNING CALORIMETRY; LIGHT REFLECTION; MAGNETRON SPUTTERING; OPTICAL PROPERTIES; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROMETERS;

HEAT INDUCED CRYSTALLIZATION; OPTICAL STORAGE; REFLECTIVITY;

OPTICAL FILMS;

EID: 4744354696     PISSN: 02532239     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

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2. Akahira N, Ohta T, Takenaga M et al.. Sub-oxide thin films for an optical recording disk. Proc. SPIE, 1982, 329: 195-201
3. Afonso C N, Morilla M C, Solis J et al.. Fast-crystallizing Sb-based thin films under pico- and nanosecond laser pulses. Mater. Sci. Engng., 1993, A173: 343-346
4. x films. Philosophical Magazine A, 1999, 79(10): 2577-2590
5. Men Liqiu, Tominaga Junji, Fuji Hiroshi et al.. The Effects of metal-doped GeSbTe films on light scattering-mode super-resolution near-field structure (Super-RENS). Jpn. J. Appl. Phys., 2001, 40(3B): 1629-1633