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Volumn 52, Issue 10, 2004, Pages 3036-3045

Performance prediction methodology for biometric systems using a large deviations approach

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; FEATURE EXTRACTION; INFORMATION THEORY; MATHEMATICAL MODELS; PATTERN RECOGNITION; RANDOM PROCESSES; RELIABILITY;

EID: 4744340839     PISSN: 1053587X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSP.2004.833863     Document Type: Article
Times cited : (37)

References (35)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.