Diffusion in metallic glasses: Analysis from the atomic bond defect perspective

Acta Materialia

Volumn 56, Issue 14, 2008, Pages 3550-3557

  Zhu, A ^a   Shiflet, G J ^a   Poon, S J ^a  

^a University of Virginia   (United States)

Author keywords

Atomic bond deficiency; Deeply undercooled liquids; Defect; Diffusion; Metallic glass

Indexed keywords

ACTIVATION ENERGY; ALLOYS; ATOMIC PHYSICS; CHEMICAL ACTIVATION; DIFFUSION; GLASS; ISOTOPES; LIQUID METALS; MATRIX ALGEBRA; METALLIC GLASS; NICKEL; NICKEL ALLOYS; PHOTOACOUSTIC EFFECT; PRESSURE EFFECTS; SEMICONDUCTOR DOPING; ZIRCONIUM;

(E ,3E) PROCESS; ATOMIC BONDS; BOND STRENGTHS; DIFFUSING ATOMS; EXPERIMENTAL MEASUREMENTS; MATRIX ATOMS; NEAREST NEIGHBOR (NN); PRE EXPONENTIAL FACTORS; SIZE EFFECTS; TRACER DIFFUSION; UNDERCOOLED LIQUIDS;

ATOMS;

EID: 47349126579     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2008.03.040     Document Type: Article

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