On NBTI degradation process in digital logic circuits

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 2007, Pages 723-728

  Yang, Xiangning ^a   Weglarz, Eric ^a   Saluja, Kewal ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER ARCHITECTURE; COMPUTER PROGRAMMING LANGUAGES; COMPUTER SCIENCE; COMPUTER SYSTEMS; DEGRADATION; DIGITAL ARITHMETIC; DIGITAL CIRCUITS; DIGITAL INTEGRATED CIRCUITS; FUZZY LOGIC; INTEGRATED CIRCUITS; LEAD; LOGIC CIRCUITS; NANOTECHNOLOGY; NEGATIVE TEMPERATURE COEFFICIENT; RESEARCH; SULFATE MINERALS; SWITCHING CIRCUITS; SWITCHING THEORY; THERMODYNAMIC STABILITY;

ARCHITECTURE LEVEL; DEVICE PHYSICS; DIGITAL LOGIC CIRCUITS; IN DEPTH STUDIES; INTERNATIONAL CONFERENCES; NANOSCALE TECHNOLOGIES; NBTI DEGRADATION; NEGATIVE BIAS- TEMPERATURE-INSTABILITY (NBTI); RESEARCH DIRECTIONS; VLSI DESIGNS;

EMBEDDED SYSTEMS;

EID: 47349117652     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSID.2007.117     Document Type: Conference Paper

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