Performance of the effective index method in the modeling of nanoscale rectangular apertures in a real metal

Optics Communications

Volumn 281, Issue 17, 2008, Pages 4526-4529

  Kumar, Arun ^a   Srivastava, Triranjita ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

Photonic integrated circuit; Plasmonics; Surface plasmon polaritons

Indexed keywords

METALS; OPTICAL WAVEGUIDES;

EFFECTIVE INDEX METHOD (EIM); ELSEVIER (CO); MODAL CHARACTERISTICS; NANO SCALING; RECTANGULAR HOLES; SUB WAVELENGTH; SURFACE PLASMON POLARITON (SPP);

SURFACE PLASMON RESONANCE;

EID: 47349116788     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2008.04.040     Document Type: Article

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