Observation of size dependent structural defects in silicon nanowires

Digest of Papers - Microprocesses and Nanotechnology 2007; 20th International Microprocesses and Nanotechnology Conference, MNC

Volumn , Issue , 2007, Pages 536-537

  Akhtar, Saeed ^a   Usami, K ^a   Tsuchiya, Y ^a,c   Mizuta, H ^b,c   Oda, S ^a,c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 47349116344     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMNC.2007.4456341     Document Type: Conference Paper

References (2)

1. Y. Huang, X. Duan, and C. M. Lieber: Small. 1 (2005) 142.
2. th International Conference on Si Epitaxy and Heterostructures, Marseille (May 2007) p. 327.