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Volumn , Issue , 2007, Pages 82-85

The effect of conductor radius and insulation thickness in the application of the enlargement law for comparing power cable breakdown performances

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC COMPOUNDS; CROSSINGS (PIPE AND CABLE); INSULATING MATERIALS; PAPER; TELECOMMUNICATION CABLES;

EID: 47349109806     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSD.2007.4290758     Document Type: Conference Paper
Times cited : (5)

References (6)
  • 1
    • 0038008565 scopus 로고
    • Statistical techniques for high voltage engineering
    • London, UK: Peter Peregrinus Ltd
    • W. Hauschild and W. Mosch, Statistical techniques for high voltage engineering, IEE Power Series, London, UK: Peter Peregrinus Ltd, 1992.
    • (1992) IEE Power Series
    • Hauschild, W.1    Mosch, W.2
  • 2
    • 51549111399 scopus 로고    scopus 로고
    • On the application of the enlargement law to cable lines
    • St. Petersburg, Russia, June 27-30
    • M. Marzinotto, "On the application of the enlargement law to cable lines", Proc. IEEE Power Tech 2005, St. Petersburg, Russia, June 27-30, 2005.
    • (2005) Proc. IEEE Power Tech
    • Marzinotto, M.1
  • 3
    • 35348927694 scopus 로고    scopus 로고
    • Comparison of breakdown performances of extruded cables via the enlargement law
    • Kansas City, USA, October 16-19
    • M. Marzinotto, G. Mazzanti and C. Mazzetti, "Comparison of breakdown performances of extruded cables via the enlargement law", Proc. IEEE CEIDP, pp. 760-763, Kansas City, USA, October 16-19, 2006.
    • (2006) Proc. IEEE CEIDP , pp. 760-763
    • Marzinotto, M.1    Mazzanti, G.2    Mazzetti, C.3
  • 6
    • 35348928334 scopus 로고    scopus 로고
    • Impulsive strength of power cables with different XLPE compounds
    • Kansas City, USA, October 16-19
    • M. Marzinotto, C. Mazzetti, M. Pompili and P. Schiaffino, "Impulsive strength of power cables with different XLPE compounds", Proc. IEEE CEIDP, Kansas City, USA, October 16-19, 2006.
    • (2006) Proc. IEEE CEIDP
    • Marzinotto, M.1    Mazzetti, C.2    Pompili, M.3    Schiaffino, P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.