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Volumn 277, Issue , 2008, Pages 31-42

Measuring patent similarity by comparing inventions functional trees

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED ANALYSIS; ELECTRIC CIRCUIT BREAKERS; INNOVATION; RISK ASSESSMENT; RISK PERCEPTION; TECHNOLOGICAL FORECASTING;

EID: 47249098446     PISSN: 15715736     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-0-387-09697-1_3     Document Type: Conference Paper
Times cited : (58)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.