Assessing a binary measurement system

Journal of Quality Technology

Volumn 40, Issue 3, 2008, Pages 310-318

  Danila, Oana ^a,b   Steiner, Stefan H ^a,b,c   Mackay, R Jock ^a,b  

^a UNIVERSITY OF WATERLOO   (Canada)

^b Department of Statistics and Actuarial Science ^*

^c Business and Industrial Statistics Research Group

Author keywords

Gauge R R; Go no go testing; Inspection errors; Misclassification rates; Pass fail inspection

Indexed keywords

INSPECTION;

100% INSPECTION; BINARY MEASUREMENTS; GO/NO-GO; INDUSTRIAL CONTEXT; INSPECTION ERRORS; MEASUREMENT SYSTEM; MISCLASSIFICATION RATES; PRODUCTION PROCESS;

BINS;

EID: 47149095571     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2008.11917736     Document Type: Article

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