On-line spectrometer for FEL radiation at FERMI@Elettra

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 593, Issue 1-2, 2008, Pages 129-131

  Frassetto, Fabio ^a   Cocco, Daniele ^b   Zangrando, Marco ^c   Poletto, Luca ^a  

^a CNR   (Italy)

^b SINCROTRONE TRIESTE   (Italy)

^c TASC INFM CNR National Laboratory   (Italy)

Author keywords

Diffraction grating; Extreem ultraviolet; Free electron laser; Optical instruments; Soft X rays; Spectrometers

Indexed keywords

FACILITIES; FERMIONS; HEALTH; PULSED LASER DEPOSITION; RADIATION; SPECTROMETERS; SPECTROMETRY;

ELSEVIER (CO); EN ERGY SPECTRUM; EXPERIMENTAL CONDITIONS; FREE ELECTRON LASER (FEL); GRAZING INCIDENCE; LOW REPETITION RATE; OPTICAL LAYOUTS; PLANE GRATING; SOFT X RAY (SXR);

FREE ELECTRON LASERS;

EID: 47049105536     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2008.04.031     Document Type: Article

References (6)

1. C.J. Bocchetta, et al., FERMI@elettra: a seeded FEL facility for EUV and Soft X-rays, in: Proceedings of the FEL Conference, 2006.
2. G. De Ninno, et al., Design and performance of the FERMI@elettra FEL, in: Proceedings of the FEL Conference, 2006.
3. Poletto L., and Tondello G. Appl. Opt. 39 (2000) 5671
4. Andrejczuk A. et al., Investigations of damage thresholds of optical components at the VUV TESLA FEL Phase I, HASYLAB Annual Report 2001.
5. Burton W.M., and Powell B.A. Appl. Opt. 12 (1973) 87
6. Placentino L., et al. Opt. Eng. 35 (1996) 3342