Effect of secondary fluorescence on electron microprobe analysis of Fe in plagioclase

Japanese Magazine of Mineralogical and Petrological Sciences

Volumn 30, Issue 4, 2001, Pages 159-163

  Sugawara, Tom ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

EPMA; Iron content; Plagioclase; Secondary fluorescence

Indexed keywords

EID: 47049104101     PISSN: 1345630X     EISSN: 13497979     Source Type: Journal    
DOI: 10.2465/gkk.30.159     Document Type: Article

References (21)

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