A study on surface material measures for areal surface texture measuring instruments - Measuring conditions for the areal profiling

Key Engineering Materials

Volumn 381-382, Issue , 2008, Pages 241-244

  Nemoto, K ^a   Yanagi, K ^a   Aketagawa, M ^a   Kanda, D ^a   Yoshida, I ^b   Uchidate, M ^c  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c IWATE UNIVERSITY   (Japan)

Author keywords

Areal surface texture; Calibration; Material measure; Software gauge; Surface metrology

Indexed keywords

CALIBRATION; GAGES; SURFACE ROUGHNESS; TOPOGRAPHY;

AUTO REGRESSIVE MODELS; GEOMETRICAL CHARACTERISTICS; MEASURING CONDITIONS; MEASURING INSTRUMENTS; SURFACE METROLOGY; SURFACE ROUGHNESS PARAMETERS; SURFACE TEXTURE PARAMETERS; SURFACE TEXTURES;

TEXTURES;

EID: 47049100861     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/kem.381-382.241     Document Type: Article

References (4)

1. ISO 5436-1: 2000, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Measurement standards - Fart 1: Material measures (JIS B 0659-1: 2002)
2. ISO 4288: 1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method -Rules and procedure for the assessment of surface texture (JIS B 0633: 2001)
3. M. Uchidate, T. Shimizu, A. Iwabuchi and K. Yanagi, Wear, 257, (2004), 1288-1295
4. K. Nemoto, M. Aketagawa, M. Uchidate, K. Yanagi, H. Maruyama, D. Kanda and I. Yoshida, Program and Abstracts Second International Symposium on Standard Materials And Metrology for Nanotechnology, (2006), P2-2