Metastability of MCM-41 and Al-MCM-41

Journal of Physical Chemistry A

Volumn 112, Issue 15, 2008, Pages 3386-3390

  Guthrie, Colin P ^a   Reardon, Eric J ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; DISSOLUTION; ELECTRON BEAM LITHOGRAPHY; EXPERIMENTS; FIELD EMISSION; MODEMS; NITROGEN; NONMETALS; OXIDE MINERALS; PHOTODEGRADATION; QUARTZ; SCANNING ELECTRON MICROSCOPY; SILICA; SILICATE MINERALS; SILICON COMPOUNDS; STANDARDS; SULFATE MINERALS; SURFACE ANALYSIS; SURFACE REACTIONS; SURFACES; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

AL MCM 41 (20); AMBIENT TEMPERATURES; AMERICAN CHEMICAL SOCIETY (ACS); AMORPHOUS SILICA; CRYSTALLINITY; FIELD-EMISSION SCANNING ELECTRON MICROSCOPE (FE-SEM); HEXAGONAL SYMMETRY; HIGH SURFACE AREA (HSA); MESOPOROUS; META STABILITY; MINIMUM GIBBS FREE ENERGY; SURFACE AREA (SA); X RAY DIFFRACTION (XRD);

MESOPOROUS MATERIALS;

EID: 47049098827     PISSN: 10895639     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp710434y     Document Type: Article

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