Photocurrent spectroscopy applied to the characterization of passive films on sputter-deposited Ti-Zr alloys

Corrosion Science

Volumn 50, Issue 7, 2008, Pages 2012-2020

  Santamaria, M ^a   Di Quarto, F ^a   Habazaki, H ^b  

^a UNIVERSITY OF PALERMO   (Italy)

^b HOKKAIDO UNIVERSITY   (Japan)

Author keywords

A. Passive film; A. Ti Zr alloys; B. Photocurrent spectroscopy; C. Band gap; C. Flat band potential

Indexed keywords

ALLOYS; METALLIC COMPOUNDS; PHOTOCURRENTS; SEMICONDUCTING CADMIUM TELLURIDE; SPUTTERING; ZIRCONIUM; ZIRCONIUM ALLOYS;

AIR EXPOSURE; APPLIED (CO); FORMATION VOLTAGE; MIXED OXIDE (MOX); PASSIVE FILMS; PHOTOCURRENT SPECTROSCOPY (PCS); PHOTOELECTROCHEMICAL;

TITANIUM ALLOYS;

EID: 47049092105     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.corsci.2008.04.014     Document Type: Article

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