X-ray diffraction study of directionally grown perylene crystallites

Journal of Physical Chemistry C

Volumn 112, Issue 12, 2008, Pages 4569-4572

  Breiby, Dag W ^a   Lemke, Henrik T ^b   Hammershøj, Peter ^b   Andreasen, Jens W ^c   Nielsen, Martin M ^b,c  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

^b UNIVERSITY OF COPENHAGEN   (Denmark)

^c TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLITES; DIFFRACTION; ELECTRON TRANSITIONS; LITHOGRAPHY; NANOCRYSTALLINE ALLOYS; NONMETALS; POPULATION STATISTICS; SILICON; X RAY ANALYSIS; X RAY DIFFRACTION;

GRAZING INCIDENCE X-RAY DIFFRACTION (GIXRD); MONOCLINIC UNIT CELL; PERYLENE (PE); POLY TETRAFLUOROETHYLENE (PTFE); SCATTERED INTENSITY; SCATTERING DATA; SILICON (111) SUBSTRATES; X-RAY DIFFRACTION STUDIES;

SUBSTRATES;

EID: 47049083924     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp076290o     Document Type: Article

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