Fault diagnosis method for analog circuit based on testability analysis and support vector machine

Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument

Volumn 29, Issue 6, 2008, Pages 1182-1186

  Sun, Yongkui ^a   Chen, Guangju ^a   Li, Hui ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Analog circuit; Fault diagnosis; Support vector machine; Testability analysis

Indexed keywords

EID: 46949112091     PISSN: 02543087     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)