Scanning tunneling microscopy of template-stripped au surfaces and highly ordered self-assembled monolayers

Langmuir

Volumn 24, Issue 12, 2008, Pages 5984-5987

  Lee, Sangyeob ^a   Bae, Sung Soo ^b   Medeiros Ribeiro, Gilberto ^c   Blackstock, Jason J ^c   Kim, Sehun ^b   Stewart, Duncan R ^c   Ragan, Regina ^a  

^a Irvine   (United States)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^c HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

(1 1 0) SURFACE; AMERICAN CHEMICAL SOCIETY (ACS); ATOMIC RESOLUTIONS; AU(111) FILMS; AU(111) SURFACES; DOMAIN SIZES; HIGH QUALITY (HQ); IN-SITU; OCTANETHIOL (OT); PRISTINE SURFACES; SELF ASSEMBLED MONOLAYER (SAMS); SELF ASSEMBLED MONOLAYERS (SAMS); SOLUTION PHASE; STRIPPING PROCESSES; SUPERLATTICE (SL); SURFACE PREPARATIONS; ULTRA-HIGH VACUUM (UHV); VAPOR PHASE;

ELECTRON ENERGY LEVELS; ELECTRON TUNNELING; EXCAVATION; GOLD; GOLD ALLOYS; MICROSCOPIC EXAMINATION; MISSILE BASES; MONOLAYERS; ORGANIC POLYMERS; PHOTORESISTS; QUANTUM CHEMISTRY; SCANNING; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; STRIPPING (DYES); TUNNELING (EXCAVATION); ULTRAHIGH VACUUM; VACUUM; VACUUM TECHNOLOGY; VAPORS;

SELF ASSEMBLED MONOLAYERS;

GOLD; SILICON;

ARTICLE; CHEMICAL STRUCTURE; CHEMISTRY; ELECTROCHEMISTRY; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; PARTICLE SIZE; PHYSICAL CHEMISTRY; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY; TEMPERATURE; TIME;

CHEMISTRY, PHYSICAL; ELECTROCHEMISTRY; EQUIPMENT DESIGN; GOLD; MICROSCOPY, SCANNING TUNNELING; MOLECULAR STRUCTURE; PARTICLE SIZE; SILICON; SURFACE PROPERTIES; TEMPERATURE; TIME FACTORS;

EID: 46949111962     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la800265q     Document Type: Article

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