![]() |
Volumn 24, Issue 12, 2008, Pages 5984-5987
|
Scanning tunneling microscopy of template-stripped au surfaces and highly ordered self-assembled monolayers
|
Author keywords
[No Author keywords available]
|
Indexed keywords
(1 1 0) SURFACE;
AMERICAN CHEMICAL SOCIETY (ACS);
ATOMIC RESOLUTIONS;
AU(111) FILMS;
AU(111) SURFACES;
DOMAIN SIZES;
HIGH QUALITY (HQ);
IN-SITU;
OCTANETHIOL (OT);
PRISTINE SURFACES;
SELF ASSEMBLED MONOLAYER (SAMS);
SELF ASSEMBLED MONOLAYERS (SAMS);
SOLUTION PHASE;
STRIPPING PROCESSES;
SUPERLATTICE (SL);
SURFACE PREPARATIONS;
ULTRA-HIGH VACUUM (UHV);
VAPOR PHASE;
ELECTRON ENERGY LEVELS;
ELECTRON TUNNELING;
EXCAVATION;
GOLD;
GOLD ALLOYS;
MICROSCOPIC EXAMINATION;
MISSILE BASES;
MONOLAYERS;
ORGANIC POLYMERS;
PHOTORESISTS;
QUANTUM CHEMISTRY;
SCANNING;
SCANNING PROBE MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
STRIPPING (DYES);
TUNNELING (EXCAVATION);
ULTRAHIGH VACUUM;
VACUUM;
VACUUM TECHNOLOGY;
VAPORS;
SELF ASSEMBLED MONOLAYERS;
GOLD;
SILICON;
ARTICLE;
CHEMICAL STRUCTURE;
CHEMISTRY;
ELECTROCHEMISTRY;
EQUIPMENT DESIGN;
INSTRUMENTATION;
METHODOLOGY;
PARTICLE SIZE;
PHYSICAL CHEMISTRY;
SCANNING TUNNELING MICROSCOPY;
SURFACE PROPERTY;
TEMPERATURE;
TIME;
CHEMISTRY, PHYSICAL;
ELECTROCHEMISTRY;
EQUIPMENT DESIGN;
GOLD;
MICROSCOPY, SCANNING TUNNELING;
MOLECULAR STRUCTURE;
PARTICLE SIZE;
SILICON;
SURFACE PROPERTIES;
TEMPERATURE;
TIME FACTORS;
|
EID: 46949111962
PISSN: 07437463
EISSN: None
Source Type: Journal
DOI: 10.1021/la800265q Document Type: Article |
Times cited : (19)
|
References (25)
|