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Volumn , Issue , 2007, Pages 254-
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Innovative design platforms for reliable SoCs in advanced nanometer technologies
a
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Author keywords
[No Author keywords available]
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Indexed keywords
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
INTEGRATED CIRCUITS;
NETWORKS (CIRCUITS);
PROCESS DESIGN;
PROCESS ENGINEERING;
PROGRAMMABLE LOGIC CONTROLLERS;
(100) SILICON;
(E ,3E) PROCESS;
(OTDR) TECHNOLOGY;
ARCHITECTURE LEVEL;
COMPUTING ARCHITECTURES;
DESIGN PRODUCTIVITY;
DOMINANT FACTORS;
EMERGING TRENDS;
HIGH YIELD;
INNOVATIVE DESIGN METHODOLOGY;
INNOVATIVE DESIGNS;
INTERNATIONAL (CO);
LEVELS OF ABSTRACTION (LOA);
LOGIC BLOCKS;
LOWER POWER DENSITY;
MANUFACTURABILITY;
NANO-METER REGIMES;
NANOMETER TECHNOLOGIES;
ON LINE TESTING;
POWER SUPPLIES;
PROCESS PARAMETERS;
RANDOM VARIATIONS;
SILICON DESIGNS;
SYSTEM-ON-CHIP (SOC) DESIGNS;
SYSTEMATIC (CO);
TECHNOLOGY ADVANCES;
TEMPERATURE VARIATIONS;
TECHNOLOGY;
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EID: 46749156295
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/IOLTS.2007.41 Document Type: Conference Paper |
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Times cited : (1)
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References (0)
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