Recent development of nanomechanical property measurement

Nihon Reoroji Gakkaishi

Volumn 36, Issue 2, 2008, Pages 99-106

  Nagai, Sae ^a   Fujinami, So ^b   Nakajima, Ken ^a   Nishi, Toshio ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

Atomic force microscopy; Force distance curve; JKR theory; Nanorheology mapping

Indexed keywords

EID: 46749152193     PISSN: 03871533     EISSN: None     Source Type: Journal    
DOI: 10.1678/rheology.36.99     Document Type: Article

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