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Volumn , Issue , 2007, Pages 187-188

A systematic approach for failure modes and effects analysis of system-on-chips

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; FAILURE MODES; FLOW SIMULATION; HEALTH; PHOTOACOUSTIC EFFECT; PROGRAMMABLE LOGIC CONTROLLERS; RELIABILITY; RELIABILITY ANALYSIS; SAFETY FACTOR;

EID: 46749136438     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2007.10     Document Type: Conference Paper
Times cited : (17)

References (5)
  • 1
    • 46749123739 scopus 로고    scopus 로고
    • CEI International Standard IEC 61508
    • CEI International Standard IEC 61508, 1998-2000.
    • (1998)
  • 4
    • 34548319176 scopus 로고    scopus 로고
    • Using an innovative SoC-level FMEA methodology to design in compliance with IEC61508
    • April, Nice, France
    • R. Mariani, G. Boschi, F. Colucci, "Using an innovative SoC-level FMEA methodology to design in compliance with IEC61508", Proceedings of DATE 2007, April 2007, Nice, France
    • (2007) Proceedings of DATE 2007
    • Mariani, R.1    Boschi, G.2    Colucci, F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.