High-pressure and high-temperature behaviour of gallium oxide

Chinese Physics Letters

Volumn 25, Issue 5, 2008, Pages 1603-1605

  Ma, Yan Mei ^a   Chen, Hai Yong ^a   Yang, Kai Feng ^a   Li, Min ^a   Cui, Qi Liang ^a   Liu, Jing ^b   Zou, Guang Tian ^a  

^a JILIN UNIVERSITY   (China)

^b INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH PRESSURE ENGINEERING; X RAY DIFFRACTION;

COLD COMPRESSION; DIAMOND-ANVIL CELL; ENERGY DISPERSIVE X-RAY DIFFRACTIONS; ENERGY-DISPERSIVE X-RAY DIFFRACTION; HIGH PRESSURE AND HIGH TEMPERATURE; HIGH PRESSURE BEHAVIOUR; HIGH TEMPERATURE BEHAVIOR; HIGH TEMPERATURES AND HIGH PRESSURES; MONOCLINICS; STABLE STRUCTURES;

GALLIUM COMPOUNDS;

EID: 46749127379     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/25/5/022     Document Type: Article

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