Phase resolving microscopy by multi-plane diffraction detection

Journal of Microscopy

Volumn 231, Issue 1, 2008, Pages 115-123

  Grjasnow, A ^a   Wuttig, A ^a   Riesenberg, R ^a  

^a LEIBNIZ INSTITUTE OF PHOTONIC TECHNOLOGY   (Germany)

Author keywords

Coherence imaging; Phase measurement; Phase retrieval

Indexed keywords

BRIGHT-FIELDS; COHERENCE IMAGING; COHERENT ILLUMINATION; DIFFRACTION IMAGES; MULTI PLANES; PHASE ACCURACY; PHASE RETRIEVAL; PHASE-CONTRAST MICROSCOPY; QUANTITATIVE PHASE CONTRASTS; RETRIEVAL TECHNIQUES;

DIFFRACTION;

ALGORITHM; ARTICLE; DIAGNOSTIC ACCURACY; DIFFRACTION; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; MICROSCOPE IMAGE; NONHUMAN; OPTICAL RESOLUTION; PHASE CONTRAST MICROSCOPY; PRIORITY JOURNAL;

EID: 46749116054     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2008.02022.x     Document Type: Article

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