Photocurrent polarization anisotropy of randomly oriented nanowire networks

Nano Letters

Volumn 8, Issue 5, 2008, Pages 1352-1357

  Yu, Yanghai ^a   Protasenko, Vladimir ^b   Jena, Debdeep ^a   Xing, Huili ^a   Kuno, Masaru ^b  

^a University of Notre Dame   (United States)

^b UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM IMAGES; AU ELECTRODES; BANDWIDTH MEASUREMENTS; CDTE; ELECTRODE POTENTIALS; EXCITATION PROFILES; GAP WIDTHS; GLASS SUBSTRATES; HIGH-RESOLUTION TEM; LINEARLY POLARIZED; NANOWIRE NETWORKS; POLARIZATION ANISOTROPIES; POLARIZATION SENSITIVITIES; POLARIZATION-SENSITIVE DEVICES; SEM; SIMPLE GEOMETRIC MODELS;

ANISOTROPY; CADMIUM ALLOYS; CADMIUM COMPOUNDS; ELECTRODES; PHOTOCURRENTS; TRANSMISSION ELECTRON MICROSCOPY;

POLARIZATION;

CADMIUM DERIVATIVE; CADMIUM SELENIDE; CADMIUM TELLURIDE; NANOMATERIAL; SELENIUM DERIVATIVE; TELLURIUM;

ANISOTROPY; ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTROCHEMISTRY; ELECTROMAGNETIC FIELD; LIGHT; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; PHOTOCHEMISTRY; RADIATION EXPOSURE; REFRACTOMETRY; TRANSDUCER; ULTRASTRUCTURE;

ANISOTROPY; CADMIUM COMPOUNDS; CRYSTALLIZATION; ELECTROCHEMISTRY; ELECTROMAGNETIC FIELDS; LIGHT; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; PHOTOCHEMISTRY; REFRACTOMETRY; SELENIUM COMPOUNDS; TELLURIUM; TRANSDUCERS;

EID: 46749105628     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl080028p     Document Type: Article

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