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Volumn , Issue , 2006, Pages 213-216
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First results observed with test X-CT system using GaAs radiation detector working in single photon counting regime
a
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Author keywords
[No Author keywords available]
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Indexed keywords
DETECTORS;
ELECTRIC CONDUCTIVITY;
ELECTRIC INSTRUMENT TRANSFORMERS;
GALLIUM ALLOYS;
LIGHT MEASUREMENT;
MICROSYSTEMS;
PHOTONS;
RADIATION;
RADIATION DAMAGE;
SEMICONDUCTING GALLIUM;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICE MODELS;
SEMICONDUCTOR MATERIALS;
SEMICONDUCTOR SWITCHES;
TESTING;
CONFERENCE PROCEEDINGS;
CT SYSTEMS;
GAMMA-RAYS;
INTERNATIONAL CONFERENCES;
SEMI-INSULATING;
SINGLE PHOTON COUNTING (TCSPC);
STEPPER MOTORS;
TEST SYSTEMS;
SEMICONDUCTOR DEVICES;
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EID: 46749101819
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ASDAM.2006.331192 Document Type: Conference Paper |
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Times cited : (2)
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References (6)
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