A high S/N ratio and high full well capacity CMOS image sensor with active pixel readout feedback operation

2007 IEEE Asian Solid-State Circuits Conference, A-SSCC

Volumn , Issue , 2007, Pages 260-263

  Lee, Woonghee ^a   Akahane, Nana ^a   Adachi, Satoru ^b   Mizobuchi, Koichi ^b   Sugawa, Shigetoshi ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b Texas Instruments Japan Ltd   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COPYING; DIGITAL CAMERAS; DIGITAL IMAGE STORAGE; IMAGE SENSORS; SENSORS;

CMOS IMAGE SENSOR; HIGH S/N RATIO; SOLID-STATE CIRCUITS CONFERENCE;

PIXELS;

EID: 46749086772     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASSCC.2007.4425780     Document Type: Conference Paper

References (13)

1. J. Park, M. Mase, S. Kawahito, M. Sasaki, Y. Wakamori and Y. Ohta, "A 142dB Dynamic Range CMOS Image Sensor with Multiple Exposure Time Signals," A-SSCC Dig. Tech. Papers, pp.85-88, Nov. 2005.
2. K. Hara, H. Kubo, M. Kimura, F. Murao and S. Komori, "A Linear-Logarithmic CMOS Sensor with Offset Calibration Using an Injected Charge Signal," ISSCC Dig. Tech. Papers, pp.354-355, Feb. 2005.
3. N. Akahane, R. Ryuzaki, S. Adachi, K. Mizobuchi and S. Sugawa, "A 200dB Dynamic Range Iris-less CMOS Image Sensor with Lateral Overflow Integration Capacitor using Hybrid Voltage and Current Readout Operation," ISSCC Dig. Tech. Papers, pp.300-301, Feb. 2006.
4. S. Sugawa, N. Akahane, S. Adachi, K. Mori, T. Ishiuchi and K. Mizobuchi, "A 100 dB Dynamic Range CMOS Image Sensor Using a Lateral Overflow Integration Capacitor," ISSCC Dig. Tech. Papers, pp.352-353, Feb. 2005.
5. N. Akahane, S. Sugawa, S. Adachi, K. Mori, T. Ishiuchi and K. Mizobuchi, "A Sensitivity and Linearity Improvement of a 100-dB Dynamic Range CMOS Image Sensor Using a Lateral Overflow Integration Capacitor," IEEE J. Solid-State Circuits, 41, 4, pp.851-858, June 2006.
6. S. Adachi, S. Sugawa, N. Akahane, K. Mori, T. Ishiuchi and K. Mizobuchi, "The Tolerance for FD Dark Current and PD Overflow Current Characteristics of Wide Dynamic Range CMOS Image Sensor Using a Lateral Overflow Integration Capacitor," Proc. 2005 IEEE Workshop on CCDs and AISs, pp.153-156, June 2005.
7. S. Adachi, W. Lee, N. Akahane, H. Oshikubo, K. Mizobuchi and S. Sugawa, "A 200-ìV/e- CMOS Image Sensor with 100-ke- Full Well Capacity," 2007 Symposium on VLSI Circuits, pp.142-143, June 2007.
8. A. Krymski, N. Khaliullin and H. Rhodes, "A 2e- Noise 1.3Megapixel CMOS Sensor," Proc. 2003 IEEE Workshop on CCDs and AISs, June 2003.
9. K. B. Cho, C. Lee, S. Eikedal, A. Baum, J. Jiang, C. Xu, X. Fan and R. Kauffman, "A 1/2.5 inch 8.1Mpixel CMOS Image Sensor for Digital Cameras," 2007 ISSCC Dig. Tech. Papers, pp.508-509, Feb. 2007.
10. H. Takahashi, T. Noda, T. Matsuda, T. Watanabe, M. Shinohara, T. Endo, S. Takimoto, R. Mishima, S. Nishimura, K. Sakurai, H. Yuzurihara and S. Inoue, "A 1/2.7 inch Low-Noise CMOS Image Sensor for Full HD Camcorders," 2007 ISSCC Dig. Tech. Papers, pp.510-511, Feb. 2007.
11. M. Iwane, T. Matsuda, T. Sugai, K. Tazoe, T. Okagawa, T. Ono, T. Watanabe, K. Ogawa, H. Takahashi and S. Inoe, "52 Mega-pixel APS-Hsize CMOS Image Sensor for Super High Resolution Image Capturing," Proc. 2007 Int. Image Sensor Work Shop, pp.295-298, June 2007.
12. O. Yadid-Pecht, B. Mansoorian, E. R. Fossum and B. Pain, "Optimization of Noise and Responsivity in CMOS Active Pixel Sensors for Detection of Ultra Low Light Levels," SPIE, 3019, pp.125-136, 1997.
13. ISO Standard 12232, "Photography - Electronic still-picture cameras-Determination of ISO speed."