Defect-related photoresponse and polarization-sensitive photodetection of single ZnO nanowires

Chinese Physics Letters

Volumn 25, Issue 7, 2008, Pages 2622-2624

  Liao, Zhi Min ^a   Xu, Jun ^a   Zhang, Jing Min ^a   Yu, Da Peng ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

II-VI SEMICONDUCTORS; INCIDENT LIGHT; NANOWIRES; PHOTOCONDUCTIVITY; POLARIZATION; ZINC OXIDE;

DEFECT MECHANISMS; GREEN LASER; GREEN LIGHT; LASER INTENSITIES; PHOTO DETECTION; PHOTORESPONSES; POLARIZATION SENSITIVE; POWER-LAW DEPENDENCES; RECOMBINATION CENTRES; ZNO NANOWIRES;

DEFECTS;

EID: 46749083033     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/25/7/079     Document Type: Article

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