Defect centers and thermoluminescence in Al2O3:Si,Ti

Radiation Measurements

Volumn 43, Issue 2-6, 2008, Pages 295-299

  Gundu Rao, T K ^a   Bhatt, B C ^b   Page, P S ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

^b BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

Al2O3:Si,Ti; ESR; Thermoluminescence; TL phosphor

Indexed keywords

ANNEALING; LINEWIDTH; PHOSPHORS; PYROLYSIS; TEMPERATURE MEASUREMENT; THERMOLUMINESCENCE;

DEFECT CENTERS; TEMPERATURE RANGES; THERMAL DECAY;

ALUMINA;

EID: 46549084902     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radmeas.2007.12.049     Document Type: Article

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