Retrenching the purse: Finite exception logs, and validating the small

Proceedings of the 30th Annual IEEE/NASA Software Engineering Workshop, SEW-30

Volumn , Issue , 2006, Pages 234-245

  Banach, Richard ^a   Jeske, Czeslaw ^a   Poppleton, Michael ^b   Stepney, Susan ^c  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^c UNIVERSITY OF YORK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

SOFTWARE ENGINEERING; TOWERS;

ABSTRACT MODELING; CONCRETE MODELING; ELECTRONIC PURSES; FORMAL DEVELOPMENT; FORMAL REFINEMENT; INDUSTRIAL SCALE; LEVEL MODEL; LEVELS OF DETAIL (LOD); TOWER PATTERN;

BUILDINGS;

EID: 46449102709     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SEW.2006.28     Document Type: Conference Paper

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