New design-to-test software strategies accelerate time-to-market

Proceedings of the IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium

Volumn 29, Issue , 2004, Pages 140-143

  Lam, Hau ^a  

^a Credence Systems Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATED TEST EQUIPMENTS (ATE); STANDARD TEST INTERFACE LANGUAGES (STIL); TIMING SPECIFICATIONS;

COMPUTER SOFTWARE; CONSUMER ELECTRONICS; DESIGN FOR TESTABILITY; ITERATIVE METHODS; MICROPROCESSOR CHIPS; NETWORK PROTOCOLS; SPECIFICATIONS;

ELECTRONIC EQUIPMENT TESTING;

EID: 4644370335     PISSN: 10898190     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. The Vanishing Microprocessor, Linley Gwennap, EE Times April 08, 2004.
2. Place Your Bets: BIST or Scan, Rick Nelson, Test & Measurement World, June 9, 2003.