Expert system algorithms for identifying radiated emission problems in printed circuit boards

IEEE International Symposium on Electromagnetic Compatibility

Volumn 1, Issue , 2004, Pages 57-62

  Shim, Hwan ^a   Hubing, Todd ^a   Van Doren, T ^a   DuBroff, R ^a   Drewniak, J ^a   Pommerenke, D ^a   Kaires, Robert ^b  

^a MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

^b MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

Current driven radiation; EMC; Expert system; Voltage driven radiation

Indexed keywords

ALGORITHMS; COMPUTER SOFTWARE; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; EXPERT SYSTEMS; MAGNETIC FIELD EFFECTS; MATHEMATICAL MODELS;

ANTENNA PORTS; COMMON-MODE RADIATION; METALLIC STRUCTURES; RADIATION RESISTANCES;

PRINTED CIRCUIT BOARDS;

EID: 4644359856     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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