White-light continuum Z-scan technique for nonlinear materials characterization

Optics Express

Volumn 12, Issue 16, 2004, Pages 3820-3826

  Balu, Mihaela ^a   Hales, Joel ^a   Hagan, David J ^a   Van Stryland, Eric W ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; CRYSTALLINE MATERIALS; FLUORESCENCE; LIGHT ABSORPTION; LIGHT REFRACTION; PHOTONS; REFRACTIVE INDEX; SEMICONDUCTING ZINC COMPOUNDS;

FLUORESCENCE IMAGING; NONLINEAR OPTICS, MATERIALS; SPECTROSCOPY, NONLINEAR; WHITE-LIGHT CONTINUUM (WLC);

NONLINEAR OPTICS;

EID: 4644359693     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OPEX.12.003820     Document Type: Article

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