Enhanced transmission in near-field imaging of layered plasmonic structures

Optics Express

Volumn 12, Issue 16, 2004, Pages 3701-3706

  Bakker, Reuben M ^a   Drachev, Vladimir P ^a   Yuan, Hsiao Kuan ^a   Shalaev, Vladimir M ^a  

^a Purdue University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTRON MICROSCOPES; IMAGE ANALYSIS; IMAGE ENHANCEMENT; IMAGING TECHNIQUES; NANOSTRUCTURED MATERIALS; OPTICAL MATERIALS; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; SCANNING; SCANNING ELECTRON MICROSCOPY; SURFACE PLASMON RESONANCE;

DOUBLE LAYER STRUCTURES; NANOANTENNA EFFECTS; NEAR-FIELD IMAGING; RESONANT PLASMON OSCILLATIONS;

LIGHT TRANSMISSION;

EID: 4644337764     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OPEX.12.003701     Document Type: Article

References (12)

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