Influence of incident energy on reconstructed atomic images in X-ray fluorescence holography

Guangxue Xuebao/Acta Optica Sinica

Volumn 24, Issue 7, 2004, Pages 1004-1008

  Xie, Honglan ^a   Chen, Jianwen ^a   Gao, Hongyi ^a   Xiong, Shisheng ^a   Li, Ruxin ^a   Xu, Zhizhan ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Crystal structure; Fourier transform; Synchrotron radiation; X ray fluorescence holography

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; FLUORESCENCE; FOURIER TRANSFORMS; SYNCHROTRON RADIATION; X RAY ANALYSIS;

ATOMIC IMAGES; INCIDENT ENERGY; MICROSCOPIC IMAGING METHOD; MULTIPLE ENERGY X RAY HOLOGRAPHY; TWIN IMAGES REMOVING; X RAY FLUORESCENCE HOLOGRAPHY;

HOLOGRAPHY;

EID: 4644334089     PISSN: 02532239     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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