APFIM investigations on site occupancies of the ternary alloying elements Cr, Fe, and Re in NiAl

Ultramicroscopy

Volumn 101, Issue 2-4, 2004, Pages 139-148

  Frommeyer, G ^a   Fischer, R ^a   Deges, J ^a   Rablbauer, R ^a   Schneider, A ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

Author keywords

21; 61.10.Nz; 61.16.Fk; 61.66Dk; 61.72.Ss; Atom probe field ion microscopy; Lattice parameter; NiAl alloys; Site preference

Indexed keywords

CHROMIUM; COMPOSITION; CRYSTAL DEFECTS; CRYSTAL LATTICES; IRON; LATTICE CONSTANTS; MICROSCOPIC EXAMINATION; RHENIUM; STOICHIOMETRY; TERNARY SYSTEMS; X RAY DIFFRACTION ANALYSIS;

ATOMIC LAYER RESOLVED ATOM PROBE FIELD-ION MICROSCOPY (APFIM); ATOMIC SIZE EFFECTS; STOICHIOMETRIC COMPOSITION;

ALLOYING ELEMENTS;

ALLOY; ALUMINUM; ALUMINUM DERIVATIVE; CHROMIUM; IRON; NICKEL; RHENIUM; TRANSITION ELEMENT;

ARTICLE; CALCULATION; CHEMICAL COMPOSITION; CHEMICAL PARAMETERS; CHEMICAL STRUCTURE; COMPARATIVE STUDY; CONCENTRATION (PARAMETERS); ELECTRON MICROSCOPY; ENERGY; SOLID; STOICHIOMETRY; X RAY DIFFRACTION;

ALLOYS; ALUMINUM COMPOUNDS; CHROMIUM; IRON; MICROSCOPY, ATOMIC FORCE; NICKEL; RHENIUM; X-RAY DIFFRACTION;

EID: 4644327906     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.05.006     Document Type: Article

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