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Volumn 12, Issue 15, 2004, Pages 3443-3451

Reducing symmetric polarization aberrations in a lens by annealing

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ANTIREFLECTION COATINGS; BIREFRINGENCE; LENSES; LIGHT POLARIZATION; POLARIMETERS; POLISHING;

EID: 4644325553     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OPEX.12.003443     Document Type: Article
Times cited : (23)

References (11)
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    • High-speed imaging polarimeter
    • Polarization Measurement and Analysis J. Shaw and I. S. Tyo, eds
    • J. Wolfe and R.A. Chipman, "High-speed imaging polarimeter," in Polarization Measurement and Analysis J. Shaw and I. S. Tyo, eds. Proc SPIE 5158, 24-32 (2003)
    • (2003) Proc SPIE , vol.5158 , pp. 24-32
    • Wolfe, J.1    Chipman, R.A.2
  • 4
    • 0029313678 scopus 로고
    • Mueller matrix imaging polarimetry
    • J. Pezzaniti and R.A. Chipman, "Mueller matrix imaging polarimetry," Opt. Eng. 34, no. 6, 1558-1568, (1995)
    • (1995) Opt. Eng. , vol.34 , Issue.6 , pp. 1558-1568
    • Pezzaniti, J.1    Chipman, R.A.2
  • 5
    • 0003881170 scopus 로고
    • Chap. 22, M. Bass, ed., (McGraw Hill, New York, 2nd Edition)
    • R.A. Chipman, Handbook of Optics, Chap. 22, M. Bass, ed., (McGraw Hill, New York, 2nd Edition, 1995)
    • (1995) Handbook of Optics
    • Chipman, R.A.1
  • 6
    • 0003033476 scopus 로고
    • An interpretation of Mueller matrices based upon the polar decomposition
    • S.Y. Lu and R.A. Chipman, "An interpretation of Mueller matrices based upon the polar decomposition," J. Opt. Soc. Am. A13, 1- 8 (1995)
    • (1995) J. Opt. Soc. Am. A , vol.13 , pp. 1-8
    • Lu, S.Y.1    Chipman, R.A.2
  • 7
  • 8
    • 0141727881 scopus 로고    scopus 로고
    • Fourth- And sixth-order polarization aberrations of antireflection-coated optical surfaces
    • R.M.A Azzam and M.M.K. Howlader, "Fourth- and sixth-order polarization aberrations of antireflection-coated optical surfaces," Opt. Let. 26 no. 20, 1607-1608 (2001)
    • (2001) Opt. Let. , vol.26 , Issue.20 , pp. 1607-1608
    • Azzam, R.M.A.1    Howlader, M.M.K.2
  • 9
    • 0000819385 scopus 로고
    • Two-dimensional birefringence measurement using the phase shifting technique
    • Otani Y., T. Shimada, T.Yoshizawa, and N.Umeda, "Two-dimensional birefringence measurement using the phase shifting technique," Opt. Eng. 33, no.5, 1604-1609, (1994)
    • (1994) Opt. Eng. , vol.33 , Issue.5 , pp. 1604-1609
    • Otani, Y.1    Shimada, T.2    Yoshizawa, T.3    Umeda, N.4
  • 10
    • 79952627304 scopus 로고
    • A depolarization criterion in Mueller matrices
    • J.J. Gil and E. Bernabeu, "A depolarization criterion in Mueller matrices," Opt. Acta 32, 259-261 (1985)
    • (1985) Opt. Acta , vol.32 , pp. 259-261
    • Gil, J.J.1    Bernabeu, E.2
  • 11
    • 0022671929 scopus 로고
    • Depolarization and polarization indices of an optical system
    • J.J. Gil and E. Bernabeu, "Depolarization and polarization indices of an optical system," Opt. Acta 33, 185-189 (1986)
    • (1986) Opt. Acta , vol.33 , pp. 185-189
    • Gil, J.J.1    Bernabeu, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.