Stress-induced migration model based on atomic migration

Journal of Materials Research

Volumn 19, Issue 8, 2004, Pages 2349-2355

  Aoyagi, Minoru ^a  

^a NIPPON INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; ELASTIC MODULI; MATHEMATICAL MODELS; RESIDUAL STRESSES; THERMAL EFFECTS; THERMAL STRESS;

ATOMIC MIGRATION; STRESS INDUCED MIGRATION MODEL; TEMPERATURE CHARACTERISTICS; VOID FORMATION;

SEMICONDUCTOR DEVICES;

EID: 4644302375     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2004.0288     Document Type: Article

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