Kinematical and dynamical analyses of reflection high-energy positron diffraction (RHEPD) patterns from Si(1 1 1) 7 × 7 surfaces

Applied Surface Science

Volumn 237, Issue 1-4, 2004, Pages 34-39

  Hayashi, K ^a   Fukaya, Y ^a   Kawasuso, A ^a   Ichimiya, A ^a,b  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

Diffraction pattern; Dynamical calculation; Kinematical calculation; Reflection high energy positron diffraction; Si(1 1 1) 7 7; Total reflection

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; KINEMATICS; NUMERICAL METHODS; POSITRONS; SEMICONDUCTING SILICON;

DIFFRACTION PATTERNS; KINEMATICAL CALCULATIONS; REFLECTION HIGH ENERGY POSITRON DIFFRACTION (RHEPD); TOTAL REFLECTION;

SURFACE CHEMISTRY;

EID: 4644302115     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(04)00994-8     Document Type: Conference Paper

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