Electrochemical, spectral, and quartz crystal microgravimetric assessment of conduction band edge energies for nanocrystalline zirconium dioxide/solution interfaces

Coordination Chemistry Reviews

Volumn 248, Issue 13-14, 2004, Pages 1225-1230

  Lemon, Buford I ^a   Liu, Fang ^a   Hupp, Joseph T ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

Author keywords

Conduction band edge; Semiconductor; Zirconium dioxide

Indexed keywords

CATION; HYDROGEN; SILICON DIOXIDE; TITANIUM DIOXIDE; WATER; ZIRCONIUM OXIDE;

CONDUCTANCE; CRYSTAL STRUCTURE; ELECTROCHEMISTRY; ELECTRON TRANSPORT; ELECTRONICS; ENERGY; GRAVIMETRY; LIGHT; NANOTECHNOLOGY; PH; RADIOCHEMISTRY; REVIEW; SEMICONDUCTOR; SPECTROSCOPY; SURFACE PROPERTY;

EID: 4644285567     PISSN: 00108545     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ccr.2004.03.004     Document Type: Review

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