Analysis of X-ray diffraction line profiles of lead zirconate titanate using the fourier method

Ferroelectrics, Letters Section

Volumn 31, Issue 3-4, 2004, Pages 79-85

  Thamjaree, W ^a   Nhuapeng, W ^a   Tunkasiri, T ^a  

^a CHIANG MAI UNIVERSITY   (Thailand)

Author keywords

Fourier method; Particle; PZT

Indexed keywords

ANNEALING; ELECTRON MICROSCOPY; FOURIER TRANSFORMS; LEAD; PARTICLE SIZE ANALYSIS; RADIATION; SCANNING ELECTRON MICROSCOPY; TRANSDUCERS; X RAY DIFFRACTION;

FOURIER METHODS; LEAD ZIRCONATE TITANATE (PZT); MICROSTRAIN; PARTICLE;

ZIRCON;

EID: 4644273934     PISSN: 07315171     EISSN: None     Source Type: Journal    
DOI: 10.1080/07315170490480975     Document Type: Article

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